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Patiño-Vanegas A. (1)

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Subject: Computational Reflection Year: 2020 Year: 2019

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Title: Robust 3D surface recovery by applying a focus criterion in white light scanning interference microscopy
Author: Altamar-Mercado H. / Patiño-Vanegas A. / Marrugo A.G.
Language: Inglés
Repository: 61
Subject: Corrosion / Recovery / Reflection / Textures / 3D reconstruction / Accurate measurement / Engineered surfaces / Extensive simulations / Interference microscopy / Measurement accuracy / Standard deviation / Surface reflectivity / Surface roughness
Title: Análisis. Revista Colombiana de Humanidades: cincuenta años
Author: Fuentes Nieto, Diana María / García Jurado, Mayra Alejandra / Merchán Parra, Luis Antonio
Language: Desconocido
Repository: 40
Subject: Producción académica / Socialización de conocimiento / Investigación / Academic production / Knowledge socialization / Research / Reflection / Humanities

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